NIS5112D1R2G【PDF 7/9 页】IC ELECTRONIC FUSE HOTSWAP 8SOIC

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Sheet目录45

3页 4页 5页 6页 [7页]8页 9页

NIS5112

http://onsemi.com

DEVICE OPERATION

Basic Operation

This device is a selfprotected, resettable, electronic fuse.

It contains circuits to monitor the input voltage, output

current, die temperature, turnon di/dt and turnon dV/dt, as

well as an enable/timer function.

On application of the input voltage, the device will apply

the input voltage to the load based on the restrictions of the

controlling circuits. The dV/dt of the output voltage can be

programmed by the addition of a capacitor to the dV/dt pin,

or if left open, the output current will be limited by the

internally controlled di/dt.

The device will remain on as long as the temperature does

not exceed the 135癈 limit that is programmed into the chip.

The current limit circuit does not shut down the part but will

reduce the conductivity of the FET to maintain a constant

current as long as it remains at the set level. The input

overvoltage clamp also does not shut down the part, but will

limit the output voltage to 15 V in the event that the input

exceeds that level.

The device can be turned on and off by the enable/timer

function, which can also be used to reset the device after a

thermal fault if the thermal latch version is chosen.

An internal charge pump provides bias for the gate voltage

of the internal Nchannel power FET and also for the current

limit circuit. The remainder of the control circuitry operates

between the input voltage (V

) and ground.

dV/dt

This circuit is comprised of an operational amplifier and

current source as shown in Figure 9. The enable circuit

controls a FET that keeps the slewrate capacitor discharged

any time the device is disabled. When the enable pin is

released (lowtohigh transition) or when power is applied

with the enable pin in a high state, the dV/dt capacitor begins

to charge due to the 80 mA in the current source. The

amplifier controls the output voltage and tracks the voltage

on the dV/dt cap scaled by a factor of 2. The output voltage

will continue to ramp higher until it reaches the input

voltage, or until the 15 V clamp limits it.

The equation for the output slew rate is

dV/dt = (I/C

dV/dt

) x 2.

Where:

I is 80 mA (internal current source)

dV/dt

is the desired dV/dt capacitor value.

The dV/dt ramp begins with a small step of about 200 mV.

This step causes a current surge into the output load

capacitance which can be seen in Figure 6. The peak level

of this surge will be limited to the overload level of the

current limit.

Figure 9. dV/dt Circuit

Enable

Source

dV/dt

80 mA

Overvoltage Clamp

The overvoltage clamp consists of an amplifier and

reference. It monitors the output voltage and if the output

voltage exceeds 15 V, the gate drive of the main FET is

reduced to limit the output. This is intended to allow

operation through transients while protecting the load. If an

overvoltage condition exists for many seconds, the device

may overheat due to the voltage drop across the FET

combined with the load current. In this event, the thermal

protection circuit would shut down the device.

Enable/Timer

The enable/timer pin can function either as a direct enable

pin, or as a time delay. In the enable mode, an open collector

device is connected to this pin. When the device is in its low

impedance mode, this pin is low and the operation of the chip

is disabled. If a time delay is required, a capacitor is added

to this pin.

If a capacitor is added without an open collector device,

the turn on will be delayed from the time at which the UVLO

voltage is reached. If an open collector device is also used,

the delay will start from the time that it goes into its high

impedance state. The capacitor is charged by an internal

current source of 80 mA (typical).

The nominal trip voltage of the comparator is 2.5 V and

was designed to be compatible with most logic families. In

general, logic gates can be tied directly to this pin, but it is

recommended that this be tested.

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